Book Chapters (1)
- 1. M. S. Rana, H. R. Pota, and I. R. Petersen; "Advanced Control of Atomic Force Microscope for Faster Image Scanning", Applied Methods and Techniques for Mechatronic System, Springer-Verlag, Berlin Heidelberg, pp. 371-388, 2013
Journal Articles (8)
- 1. M. S. Rana, H. R. Pota, and I. R. Petersen; "A survey of methods used to control piezoelectric tube scanners in high-speed AFM imaging", Asian Journal of Control, vol. 20, no. 4, pp. 1379-1399, 2018
- 2. M. S. Rana, H. R. Pota, and I. R. Petersen; "Improvement in Imaging Performance of Atomic Force Microscopy: A Survey", IEEE Transactions on Automation Science and Engineering, vol. 14, no. 3, pp. 1265 - 1285, 2017
- 3. M. S. Rana, H. R. Pota, and I. R. Petersen; "Nonlinearity Effects Reduction of an AFM Piezoelectric Tube Scanner Using MIMO MPC", IEEE/ASME Transactions on Mechatronics, vol. 20, no. 3, pp. 1458–1469, 2016
- 4. M. S. Rana, H. R. Pota, I. R. Petersen, and Habibullah; "Effect of Improved Tracking for Atomic Force Microscope on Piezo Nonlinear Behavior", Asian Journal of Control, vol. 17, no. 3, pp. 1–15, 2015
- 5. M. S. Rana, H. R. Pota, and I. R. Petersen; "Performance of Sinusoidal Scanning with MPC Scheme in AFM Imaging", IEEE/ASME Transactions on Mechatronics, vol. 20, no. 1, pp. 73–83, 2015
- 6. M. S. Rana, H. R. Pota, and I. R. Petersen; "The Design of Model Predictive Control for an AFM and its Impact on Piezo Nonlinearities", European Journal of Control, vol. 20, no. 4, pp. 188–198, July 2014, 2014
- 7. M. S. Rana, H. R. Pota, and I. R. Petersen; "Spiral Scanning with Improved Control for Faster Imaging of AFM", IEEE Transactions on Nanotechnology, vol. 13, no. 3, pp. 541–550, 2014
- 8. M. S. Rana, H. R. Pota, and I. R. Petersen; "High-speed AFM Image Scanning Using Observer Based MPC-Notch Control", IEEE Transactions on Nanotechnology, vol. 12, no. 2, pp. 246–254, 2013